Focused Ion Beam Scanning Electron Microscope

Tender Notice

Tender Detail
Focused Ion Beam Scanning Electron Microscope
Tendering Authority
Tender Category
Other
Publish Date
19 May 2022
Deadline
31 May 2022
Country
Korea South
TenderNews Ref. No.
675916220519-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
USD 1335000
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