tendernews fib scanning electron microscope dual beam system purchase tender tenders from china Tender

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Tender Detail	FIB Scanning Electron Microscope Dual-Beam System Purchase
Tendering Authority	Login To View Detail Description
Tender Category	Other
Publish Date	14 Nov 2026
Deadline	01 Dec 2026
Country	CHINA
TenderNews Ref. No.	5010416261114-0
Document Fees	Refer Document.
EMD	Refer Document.
Tender Value	Refer Document.
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