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Acquisition of a high-resolution scanning electron microscope with electron column (FEG-SEM) and io
Tender Notice
Tender Detail
Acquisition of a high-resolution scanning electron microscope with electron column (FEG-SEM) and ion column (FIB) - dual beam FIB-SEM system
Tendering Authority
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Tender Category
Other
Publish Date
29 Jan 2026
Deadline
23 Feb 2026
Country
Portugal
TenderNews Ref. No.
4771416260129-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
EUR 920000
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