Xenon focused ion beam electron microscope

Tender Notice

Tender Detail
Xenon focused ion beam electron microscope
Tendering Authority
Tender Category
Other
Publish Date
04 Feb 2025
Deadline
10 Feb 2025
Country
Czech Republic
TenderNews Ref. No.
408517250204-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
Refer Document.
« Previous Tender      Next Tender »

Some of Our Valuable Clients