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Getting a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with a Gallium Ion Source set up
Tender Notice
Tender Detail
Getting a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with a Gallium Ion Source set up and ready to use
Tendering Authority
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Tender Category
Other
Publish Date
16 Oct 2026
Deadline
16 Nov 2026
Country
Denmark
TenderNews Ref. No.
3706317261016-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
Refer Document.
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