Xenon Focused Ion Beam Electron Microscope

Tender Notice

Tender Detail
Xenon Focused Ion Beam Electron Microscope
Tendering Authority
Tender Category
Other
Publish Date
04 Mar 2024
Deadline
Country
Czech Republic
TenderNews Ref. No.
3261816240304-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
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