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Acquisition of 1 (one) dual Focused Ion Beam (FIB) microscopy system coupled with a Field Emission
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Tender Detail
Acquisition of 1 (one) dual Focused Ion Beam (FIB) microscopy system coupled with a Field Emission Scanning Electron Microscope (FEG-SEM) for the Associated Laboratory CICECO - Aveiro Institute of Materials
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Tender Category
Other
Publish Date
23 Jun 2026
Deadline
28 Jun 2026
Country
Portugal
TenderNews Ref. No.
2540916260623-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
EUR 600000
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