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Focused ion beam & scanning electron microscope system (fib sem) 1 set
Tender Notice
Tender Detail
Focused ion beam & scanning electron microscope system (fib sem) 1 set
Tendering Authority
Login To View Detail Description
Tender Category
Other
Publish Date
10 Sep 2025
Deadline
31 Oct 2025
Country
Japan
TenderNews Ref. No.
2253916250910-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
Refer Document.
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