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Scanning Electron Microscopy (SEM) system equipped with FIB, 3D-EBSD, 3D-EDS detectors and a Spectr
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Tender Detail
Scanning Electron Microscopy (SEM) system equipped with FIB, 3D-EBSD, 3D-EDS detectors and a Spectrometer for simultaneous measurement of spectra for different energies, for the analysis of light metal elements including lithium (Li)
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Tender Category
Other
Publish Date
03 Sep 2025
Deadline
12 Sep 2025
Country
Slovakia
TenderNews Ref. No.
1784116250903-0
Document Fees
Refer Document.
EMD
Refer Document.
Tender Value
Refer Document.
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