tendernews focused ion electron double beam electron microscope tender tenders from china Tender

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Tender Detail	focused ion-electron double-beam electron microscope
Tendering Authority	Login To View Detail Description
Tender Category	Global Tenders
Publish Date	27 Mar 2024
Deadline	22 Apr 2024
Country	china
TenderNews Ref. No.	363051240327-0
Document Fees	Refer Document.
EMD	Refer Document.
Tender Value	Refer Document.
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